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Battery cell destruction-afflicted short-circuit testing method, involves placing measuring tip with sensor in cell, and reading temperature sensor for determining temperature inside cell based on time after placing tip
Battery cell destruction-afflicted short-circuit testing method, involves placing measuring tip with sensor in cell, and reading temperature sensor for determining temperature inside cell based on time after placing tip
The method involves placing an electrically conducting measuring tip (2) with a temperature sensor (4) in a battery cell, and reading the temperature sensor for determining the temperature inside the battery cell based on a time after placing the measuring tip. Maximum temperature obtained after placing the measuring tip is determined, and the battery cell is evaluated dependent on the maximum temperature. The battery cell is evaluated as the battery cell with a critical explosion risk, if the maximum temperature exceeds a given threshold value. Independent claims are also included for the following: (1) a measuring tip for an destruction-afflicted short-circuit testing of a battery cell (2) a method for manufacturing the battery cell.
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