首页> 外国专利> Flat X-ray detector for measurement of X-ray image dose, comprises scintillator that converts the incident X-ray beam into light, light converting layer and detector element, which receives the light from the scintillator

Flat X-ray detector for measurement of X-ray image dose, comprises scintillator that converts the incident X-ray beam into light, light converting layer and detector element, which receives the light from the scintillator

机译:用于测量X射线图像剂量的平面X射线检测器,包括将入射X射线束转换为光的闪烁体,光转换层和检测器元件,该检测器元件接收来自闪烁体的光

摘要

The flat X-ray detector for measurement of X-ray image dose, comprises a scintillator (16), which converts incident X-ray beam (14) into light, light converting layer (12), a detector element, which receives the light from the scintillator and emits electrons for production of a image data value, fiber-optic elements (20) that guide a portion of the light from the scintillator to the detector element and to a photosensitive element. The quantity of light led by the optical element is measured. The scintillator is fastened with an adhesive to the light-changing layer. The flat X-ray detector for measurement of X-ray image dose, comprises a scintillator (16), which converts incident X-ray beam (14) into light, light converting layer (12), a detector element, which receives the light from the scintillator and emits electrons for production of a image data value, fiber-optic elements (20) that guide a portion of the light from the scintillator to the detector element and to a photosensitive element. The quantity of light led by the optical element is measured. The scintillator is fastened with an adhesive to the light-changing layer. Each of the optical elements is embedded into the adhesive. The optical element is arranged in a plastic or glass layer that is present between the scintillator and the light-converting layer. The optical element is encased into the plastic or glass layer and is fastened in a recess in the transparent layer. In the X-ray-flat detector, a detector surface is formed, over which the optical elements are evenly distributed. The optical elements are partially formed as strips. Two optical elements guide light to different photocounter (22). An independent claim is included for a method for controlling X-ray tube in flat X-ray detector.
机译:用于测量X射线图像剂量的平面X射线探测器包括:闪烁器(16),其将入射的X射线束(14)转换成光;光转换层(12);探测器元件,其接收光光纤元件(20)从闪烁体发射并发射电子以产生图像数据值,所述光纤元件(20)将一部分光从闪烁体引导到检测器元件和光敏元件。测量由光学元件引导的光的量。闪烁体通过粘合剂固定在光变层上。用于测量X射线图像剂量的平面X射线探测器包括:闪烁器(16),其将入射的X射线束(14)转换成光;光转换层(12);探测器元件,其接收光光纤元件(20)从闪烁体发射并发射电子以产生图像数据值,所述光纤元件(20)将一部分光从闪烁体引导到检测器元件和光敏元件。测量由光学元件引导的光的量。闪烁体通过粘合剂固定在光变层上。每个光学元件都嵌入粘合剂中。光学元件布置在存在于闪烁体和光转换层之间的塑料或玻璃层中。光学元件被封装在塑料或玻璃层中,并固定在透明层的凹槽中。在X射线平面检测器中,形成检测器表面,光学元件均匀地分布在该检测器表面上。光学元件部分地形成为条带。两个光学元件将光引导至不同的光计数器(22)。包括用于控制平面X射线探测器中的X射线管的方法的独立权利要求。

著录项

  • 公开/公告号DE102006019416A1

    专利类型

  • 公开/公告日2007-11-15

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE20061019416

  • 发明设计人 HOERNIG MATHIAS;

    申请日2006-04-26

  • 分类号G01T1/02;G01T1/29;H04N5/32;G21K4/00;H05G1/46;

  • 国家 DE

  • 入库时间 2022-08-21 19:49:57

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