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METHOD FOR SETTING UP BIT ERROR RATE CRITERION AND METHOD FOR BURN-IN TEST OF HARD DISK DRIVE

机译:建立硬盘误码率准则的方法和预测试的方法

摘要

A method for setting up a BER(Bit Error Rate) criterion of a hard disk drive and a burn-in test method using the same are provided to minimize errors in determination of a qualified hard disk drive by modifying BER criterion in accordance with temperature variation of the hard disk drive. A burn-in test method comprises the steps of: measuring temperature of a hard disk drive(S10); modifying a BER criterion by setting a new BER criterion greater than a BER criterion at an optimum temperature for burn-in test if the measured temperature of the hard disk drive is greater than the optimum temperature for burn-in test, while setting a new BER criterion smaller than the BER criterion at the optimum temperature for burn-in test if the measured temperature of the hard disk drive is smaller than the optimum temperature for burn-in test(S20); calculating the BER of the hard disk drive(S30); and determining the hard disk drive as disqualified if the calculated BER of the hard disk drive is smaller than the new BER criterion, while determining the hard disk drive as qualified if the calculated BER is equal to or greater than the new BER criterion(S40).
机译:提供一种用于建立硬盘驱动器的BER(误码率)标准的方法和使用该方法的老化测试方法,以通过根据温度变化来修改BER准则来最小化确定合格硬盘驱动器时的误差。硬盘驱动器。老化测试方法包括以下步骤:测量硬盘驱动器的温度(S10);如果硬盘驱动器的测量温度大于老化测试的最佳温度,则在老化测试的最佳温度下,通过将新的BER基准设置为大于BER标准的BER准则来修改BER准则,同时设置新的BER如果硬盘驱动器的测量温度小于老化测试的最佳温度,则该标准小于在老化测试的最佳温度下的BER标准(S20);计算硬盘驱动器的BER(S30);如果计算出的BER小于新的BER标准,则确定硬盘驱动器为不合格;如果计算出的BER等于或大于新的BER标准,则确定硬盘驱动器为合格(S40) 。

著录项

  • 公开/公告号KR100833198B1

    专利类型

  • 公开/公告日2008-05-28

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20070023676

  • 发明设计人 LEE SANG HYUB;LEE HAE JUNG;

    申请日2007-03-09

  • 分类号G11B20/18;

  • 国家 KR

  • 入库时间 2022-08-21 19:52:05

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