AN OPTICAL MEASUREMENT SYSTEM WITH SIMULTANEOUS MULTIPLE WAVELENGTHS, MULTIPLE ANGLES OF INCIDENCE AND ANGLES OF AZIMUTH

• 1. 同时具有多波长、多入射角和多方位角的光学测量系统 [P] . 中国专利： CN101443647B . 2012.02.29
• 2. 同时具有多波长、多入射角和多方位角的光学测量系统 [P] . 中国专利： CN101443647A . 2009-05-27
• 3. AN OPTICAL MEASUREMENT SYSTEM WITH SIMULTANEOUS MULTIPLE WAVELENGTHS, MULTIPLE ANGLES OF INCIDENCE AND ANGLES OF AZIMUTH [P] . 世界知识产权组织专利： WO2007134195A3 . 2008-03-20

  机译： 具有多个同时入射角，多个入射角和多个方位角的光学测量系统

• 4. Optical Measurement System with Simultaneous Multiple Wavelengths, Multiple Angles of Incidence and Angles of Azimuth [P] . 美国专利： US2007263220A1 . 2007-11-15

  机译： 同时具有多个波长，多个入射角和方位角的光学测量系统

• 5. OPTICAL METROLOGY WITH MULTIPLE ANGLES OF INCIDENCE AND/OR AZIMUTH ANGLES [P] . 世界知识产权组织专利： WO2015084543A1 . 2015-06-11

  机译： 具有多个入射角和/或方位角的光学计量学

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• 1. Measurements of the Electrical Incidence Angle Modifiers of an Asymmetrical Photovoltaic/Thermal Compound Parabolic Concentrating-Collector [J] . Bernardo Ricardo ,Davidsson Henrik ,Gentile Niko . 工程（英文）（1947-3931） . 2013,第1期
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