首页> 外国专利> APPARATUS FOR OBSERVING AN ASSEMBLED STATE OF COMPONENTS AND METHOD OF OBSERVING AN ASSEMBLED STATE OF COMPONENTS USING SUCH APPARATUS

APPARATUS FOR OBSERVING AN ASSEMBLED STATE OF COMPONENTS AND METHOD OF OBSERVING AN ASSEMBLED STATE OF COMPONENTS USING SUCH APPARATUS

机译:用于观察组件的组装状态的设备以及使用这种设备来观察组件的组装状态的方法

摘要

When bonding a workpiece to a substrate, processed parts of the substrate and the workpiece are observed and behavior such as the production of voids and the flowing of resin is observed. An apparatus for observing an assembled state of components includes: a stage on which a substrate is set; a head mechanism that bonds, by applying heat and pressure, an observation workpiece made of a transparent material to the substrate via resin supplied between the substrate and the observation workpiece; a light source that irradiates an observed part of the substrate and the observation workpiece mounted on the stage with light; and a camera that takes, from the observation workpiece side, an image of the observed part when the observation workpiece is bonded to the substrate set on the stage.
机译:当将工件粘合到基板上时,观察到基板和工件的加工部分,并且观察到诸如空隙产生和树脂流动的行为。一种用于观察部件的组装状态的设备,包括:载置台的台架;以及设置有载物台的台架。头机构,通过施加热和压力,将透明材料制成的观察工件通过供给在基板和观察工件之间的树脂粘合到基板上。用光源照射基板的观察部位和载置于载物台上的观察工件的光源。以及从观察工件侧拍摄将观察工件粘贴在载物台上的基板上后的被观察部位的图像的照相机。

著录项

  • 公开/公告号US2008129303A1

    专利类型

  • 公开/公告日2008-06-05

    原文格式PDF

  • 申请/专利权人 SHUICHI TAKEUCHI;HIDEHIKO KIRA;

    申请/专利号US20070849069

  • 发明设计人 SHUICHI TAKEUCHI;HIDEHIKO KIRA;

    申请日2007-08-31

  • 分类号G01R31/26;

  • 国家 US

  • 入库时间 2022-08-21 20:13:24

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号