首页>
外国专利>
COMPUTER AIDED DESIGN APPARATUS, COMPUTER AIDED DESIGN PROGRAM, COMPUTER AIDED DESIGN METHOD FOR A SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING A SEMICONDUCTOR CIRCUIT BASED ON CHARACTERISTIC VALUE AND SIMULATION PARAMETER
COMPUTER AIDED DESIGN APPARATUS, COMPUTER AIDED DESIGN PROGRAM, COMPUTER AIDED DESIGN METHOD FOR A SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING A SEMICONDUCTOR CIRCUIT BASED ON CHARACTERISTIC VALUE AND SIMULATION PARAMETER
A simulation instructing unit instructs a simulation unit, which generates signal characteristics, to generate the signal characteristics. A characteristic value extracting unit extracts, from the signal characteristics, characteristic values for distinguishing between a signal characteristic generated by setting a first simulation parameter and a signal characteristic generated by a second simulation parameter. A simulation parameter determining unit determines a first mapping relationship from the characteristic values to the simulation parameters with the characteristic values obtained by setting a plurality of set values in the simulation parameters and with the set values.
展开▼
