首页> 外国专利> ASTIGMATISM MEASURING METHOD FOR ELECTROMAGNETIC LENS, ASTIGMATISM MEASURING APPARATUS, ASTIGMATISM CORRECTING METHOD, AND ELECTRON BEAM APPARATUS

ASTIGMATISM MEASURING METHOD FOR ELECTROMAGNETIC LENS, ASTIGMATISM MEASURING APPARATUS, ASTIGMATISM CORRECTING METHOD, AND ELECTRON BEAM APPARATUS

机译:电磁透镜的防散影测量方法,防散影测量装置,防散影校正方法和电子束装置

摘要

PROBLEM TO BE SOLVED: To provide an astigmatism measuring method for an electromagnetic lens, an astigmatism measuring apparatus, an astigmatism correcting method, and an electron beam apparatus, capable of measuring an astigmatism of an electromagnetic lens quantitatively and with a high degree of accuracy.;SOLUTION: An imaging part obtains Ronchigram, as an image data, occurring by entering an electron beam into a single-crystal specimen such as SrTiO3, followed by determining a center position of Rouchigram, and then subjecting Ronchigram to Fourie transform two times to perform calibration of a scale of the image. Next, subjecting Ronchigram to the Fourie transform one time causing a one time Fourie transform image to be obtained, followed by detecting a deviation amount of the luminescent spot from the crystal orientation to calculate an astigmatism coefficient. The calculated result provides control of a deflecting coil for correcting the astigmatism to correct the astigmatism of the electromagnetic lens.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:提供一种电磁透镜的像散测量方法,像散测量设备,像散校正方法和电子束设备,其能够定量地并且高精度地测量电磁透镜的像散。 ;解决方案:成像部件通过将电子束入射到单晶试样(例如SrTiO 3 )中,然后确定Rouchigram的中心位置,然后得到Ronchigram,作为图像数据。 Ronchigram到Fourie变换两次以执行图像比例的校准。接下来,对Ronchigram进行一次傅里叶变换,从而获得一次傅里叶变换图像,然后检测发光点与晶体取向的偏离量,以计算像散系数。计算结果为偏转线圈的控制提供了校正像散的方法,以校正电磁透镜的像散。;版权所有:(C)2008,JPO&INPIT

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