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FAILURE DIAGNOSIS DEVICE AND FAILURE DIAGNOSIS TECHNIQUE
FAILURE DIAGNOSIS DEVICE AND FAILURE DIAGNOSIS TECHNIQUE
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机译：故障诊断装置和故障诊断技术
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摘要
PROBLEM TO BE SOLVED: To provide a failure diagnosis device without constraint of operating states in semiconductor integrated circuit devices equipped with a BIST circuit of the space compression system.;SOLUTION: The failure diagnosis device, based on circuit information on LSI, establishes test output compression circuits 36a and 36b compressing output signal from scan flip-flops 34a to 36a and 34b to 36b of each stage and virtual pins PT1 and PT0 connected to the output terminal of the compression circuits 36a and 36b concerned for every stage of each scan chain. Thus, by comparing the signal in virtual pins PT1 and PT0 based on failure assumed to virtual circuit data with the observed result of the signal in the test output terminal resulting from test implementation in the LSI, the failure diagnosis device diagnoses failure of the LSI.;COPYRIGHT: (C)2009,JPO&INPIT
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