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Semiconductor structure e.g. conducting path, testing circuit arrangement, has impulse generator with transmission lines whose impedances form system impedance, and absorption branch with resistance having same value as system impedance
Semiconductor structure e.g. conducting path, testing circuit arrangement, has impulse generator with transmission lines whose impedances form system impedance, and absorption branch with resistance having same value as system impedance
The arrangement has an impulse generator with a transmission line (4), which has a length specifying maximum impulse duration and is connected at a direct current voltage source (1). A transmission line (6) connects a device under test at the output of the generator that is formed by a switch. The impedances of the lines form system impedance, and an absorption branch has a resistance with the same value as the system impedance. An independent claim is also included for a method for testing a semiconductor structure by using a circuit arrangement.
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