首页>
外国专利>
Atomic force microscope usage method involves analyzing variation of oscillation amplitude and phase of output signal for obtaining topographic information and compositional information in relation to sample
Atomic force microscope usage method involves analyzing variation of oscillation amplitude and phase of output signal for obtaining topographic information and compositional information in relation to sample
The method involves performing a bimodal excitation of the microlever (M) which is attached on the sample and analyzing the variation in the oscillation amplitude of the output signal for obtaining the topographic information in relation to the sample. The variation in the phase of output signal is analyzed for obtaining the compositional information in relation to the sample.
展开▼
