首页> 外国专利> NEAR-FIELD LIGHT MICROSCOPE, NEAR-FIELD LIGHT IMAGING METHOD, NEAR-FIELD LIGHT IMAGING DEVICE, AND PROGRAM FOR MAKING COMPUTER EXECUTE NEAR-FIELD LIGHT IMAGING METHOD, RECORDING MEDIUM, AND HIGH-DENSITY RECORDING INFORMATION MEDIA READING DEVICE

NEAR-FIELD LIGHT MICROSCOPE, NEAR-FIELD LIGHT IMAGING METHOD, NEAR-FIELD LIGHT IMAGING DEVICE, AND PROGRAM FOR MAKING COMPUTER EXECUTE NEAR-FIELD LIGHT IMAGING METHOD, RECORDING MEDIUM, AND HIGH-DENSITY RECORDING INFORMATION MEDIA READING DEVICE

机译：近场光显微镜，近场光成像方法，近场光成像设备以及用于制造计算机执行近场光成像方法，记录介质和高密度记录信息媒体读取设备的程序

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摘要

PROBLEM TO BE SOLVED: To provide a near-field light imaging method/device for determining distribution from observation data using a near-field light microscope and an inverse analysis algorithm, to provide a near-field light microscope that is related to a high-density recording information media employing the near-field light imaging method and employs a thin film slit instead of a fiber probe, and a high-density recording information media reading device employing the near-field light imaging method and the principle of the near-field light microscope.;SOLUTION: The near-field light microscope, high-density recording information media reading device, and the like comprise a light source for generating light, a thin film slit for generating near-field light with the light guided from the light source and radiating the near-field light to a sample, and a detector for detecting transmitted light generated or scattered light reflected by radiating the near-field light to the sample. The thin film slit comprises a transmission layer and an external layer, light guided from the light source to the transmission layer is introduced, and the near-field light is radiated to the sample.;COPYRIGHT: (C)2007,JPO&INPIT

机译：要解决的问题：提供一种近场光成像方法/设备，用于使用近场光显微镜和逆分析算法根据观测数据确定分布，以提供一种与高倍率相关的近场光显微镜。密度记录信息介质采用近场光成像方法并采用薄膜狭缝代替纤维探针，以及高密度记录信息介质读取设备采用近场光成像方法和近场原理解决方案：近场光学显微镜，高密度记录信息介质读取设备等包括用于产生光的光源，用于在光的引导下产生近场光的薄膜狭缝。光源将近场光照射到样品上，以及检测器，该检测器用于检测透射的光或通过将近场光照射到样品而反射的散射光。薄膜狭缝包括一个透射层和一个外层，从光源引导到透射层的光被引入，近场光被照射到样品上。版权所有：（C）2007，JPO＆INPIT

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公开/公告号JP2007139466A

专利类型
公开/公告日2007-06-07

原文格式PDF
申请/专利权人 TOKYO INSTITUTE OF TECHNOLOGY;
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申请/专利号JP20050330559
发明设计人 AMAYA KENJI;YAMAKAWA SHINICHI;
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申请日2005-11-15
分类号G01N13/14;G11B7/135;G11B7/125;G01N13/10;
国家 JP
入库时间 2022-08-21 21:11:20

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