首页> 外国专利> Film pattern`s faults e.g. scratches, detecting method, involves comparing grey values that are adjacent to both sides of linear formed structures with grey values of structures and providing scratch fault during acquisition of grey value

Film pattern`s faults e.g. scratches, detecting method, involves comparing grey values that are adjacent to both sides of linear formed structures with grey values of structures and providing scratch fault during acquisition of grey value

机译:胶卷图案的故障,例如划痕的检测方法,涉及将与线性成形结构的两侧相邻的灰度值与结构的灰度值进行比较,并在获取灰度值时提供划痕故障

摘要

The method involves producing a pixel shifted picture to determine scratches in the picture and removing the picture from an original picture. Grey values that are adjacent to both sides of linear formed structures are compared with grey values of the structures. A scratch fault is provided during acquisition of grey value transfer concerning both sides of the structure for establishing a certain quantity of pixel per length. An independent claim is also included for a device for detecting faults in a film pattern.
机译:该方法包括产生像素移位的图片以确定图片中的划痕,并从原始图片中删除图片。将与线性形成的结构的两侧相邻的灰度值与该结构的灰度值进行比较。在获取灰度值转移期间,在涉及结构的两侧的地方提供了划痕故障,以在每个长度上建立一定数量的像素。还包括用于检测胶片图案中的故障的设备的独立权利要求。

著录项

  • 公开/公告号DE102004005299A1

    专利类型

  • 公开/公告日2005-12-29

    原文格式PDF

  • 申请/专利权人 DEUTSCHES ZENTRUM FUER LUFT- UND RAUMFAHRT E.V.;

    申请/专利号DE20041005299

  • 发明设计人 HETZHEIM HARTWIG;

    申请日2004-01-29

  • 分类号G06K9/03;H04N5/253;

  • 国家 DE

  • 入库时间 2022-08-21 21:21:00

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