首页> 外国专利> Apparatus for Teaching Working Position of Picker in Semiconductor Test Handler and Method for Teaching Working Position of the Same

Apparatus for Teaching Working Position of Picker in Semiconductor Test Handler and Method for Teaching Working Position of the Same

机译:半导体测试处理器中的拾取器教学工作位置的装置及其教学工作位置的方法

摘要

the present invention is a semiconductor device test handler of the picker of location-aware devices and how to work on that , picker the process of recognizing the work location is one to be made very easily and precisely . ; and the tray receiving part the present invention is that the device packaging tray placed for this purpose , according to the holding with a picker for transferring to a storage device handler on the tray , the tray portion one piece seat extending to the upper side and the lower side be formed teaching pin ; Have the same cross-sectional shape and size as the cross-sectional shape and size of the lower pin teaching , and provides a working position recognition device of the picker of a semiconductor device test handler is configured , including the upper side of the lower pin is formed to extend to the lower side to the teaching of the picker .
机译:本发明是一种用于位置感知设备的拾取器的半导体器件测试处理器,以及如何在该器件上进行工作,该拾取器识别工作位置的过程非常容易且精确。 ;本发明的托盘容纳部是放置在该装置的包装托盘上,并带有用来转移到托盘上的存储设备搬运装置的拾取器,该托盘部分整体延伸到上侧。下侧形成教学销;具有与下销示教的截面形状和尺寸相同的横截面形状和尺寸,并提供了配置有半导体器件测试处理器的拾取器的工作位置识别装置,包括下销的上侧形成延伸到采摘者的下端。

著录项

  • 公开/公告号KR100570198B1

    专利类型

  • 公开/公告日2006-04-12

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20040014277

  • 申请日2004-03-03

  • 分类号G01R31/26;

  • 国家 KR

  • 入库时间 2022-08-21 21:24:00

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