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Mount for mounting a sample for inspection by a transmission electron microscope and method of manufacturing a sample using the same
Mount for mounting a sample for inspection by a transmission electron microscope and method of manufacturing a sample using the same
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机译：用于安装样品以进行透射电子显微镜检查的安装座以及使用该安装座的样品的制造方法
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摘要
In the process of making specimens for transmission electron microscopy , grinding to have the target thickness of the specimen is pre-set while the piece is secured to the mount. And the first groove in which the specimen is inserted, the upper surface of the mount , and the second groove is formed to separate the specimen from the first groove . The specimen is fixed to the first mounting groove using a wax , the portion protruding from the mount is grinding by a grinder . The depth of the first groove is determined by the target thickness of the specimen , the protruding portion of the specimen to the upper surface of the grinding is mounted. Thus , the sample having a target thickness can be readily produced .
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