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IONISING PARTICLE ANALYSER ENABLING FOR EXEMPLE THE SEPARATION OF THE FLUORESCENT YIELD (FY) AND THE TOTAL ELECTRON YIELD (TEY) IN EXAFS (EXTENDED X-RAY ABSORPTION FINE STRUCTURE) MEASUREMENTS
IONISING PARTICLE ANALYSER ENABLING FOR EXEMPLE THE SEPARATION OF THE FLUORESCENT YIELD (FY) AND THE TOTAL ELECTRON YIELD (TEY) IN EXAFS (EXTENDED X-RAY ABSORPTION FINE STRUCTURE) MEASUREMENTS
An ionising particle analyser comprises a source of ionising particles, a charged particle detector, and an ionisable gas located between the source and the detector. The analyser further comprises a charged particle impeding device located between the source and the detector. The charged particle impeding device is arranged to be maintained in a first configuration at a potential to impede the passage of charged particles and pass uncharged particles.
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