首页> 外国专利> Thin film magnetic field sensor structure having magneto-resistive multilayer system with spin dependent electron scattering

Thin film magnetic field sensor structure having magneto-resistive multilayer system with spin dependent electron scattering

机译:具有具有自旋相关电子散射的磁阻多层系统的薄膜磁场传感器结构

摘要

The thin film structure of a sensor includes a multi-layer system having an increased magnetoresistive effect which has a spin dependence of electron scattering at an interface (R1, R2) as well as diffuse scattering of non-reflected electrons is. The spin-dependent reflective interface (R1, R2) should be between neighboring layers (M1, Z or M2, Z) are made of a magnetic or non-magnetic material, wherein the materials are adapted to each other grid dimensions have and are non-miscible. The layers (M1, M2) of magnetic material are preferably divided into spin selectively reflective and scattering regions.
机译:传感器的薄膜结构包括具有增强的磁阻效应的多层系统,该磁阻效应具有界面(R1,R2)处电子散射的自旋依赖性以及未反射电子的散射。自旋相关的反射界面(R1,R2)应位于相邻层之间(M1,Z或M2,Z)由磁性或非磁性材料制成,其中这些材料彼此适应,网格尺寸分别为-混溶的。磁性材料层(M1,M2)优选地分为自旋选择性反射和散射区域。

著录项

  • 公开/公告号EP0993054A3

    专利类型

  • 公开/公告日2005-12-28

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号EP19990118468

  • 发明设计人 VAN DEN BERG HUGO DR.;PERSAT NATHALIE;

    申请日1999-09-17

  • 分类号H01L41/08;

  • 国家 EP

  • 入库时间 2022-08-21 21:33:23

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