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Methodology for the optimization of testing and diagnosis of analog and mixed signal ICs and embedded cores

机译:优化模拟和混合信号IC和嵌入式内核的测试和诊断的方法

摘要

A method for analyzing an integrated circuit (IC) having at least one of the group consisting of digital and analog components, where the IC is designed to meet a plurality of circuit performance specifications, and fabrication of the IC is monitored by measuring process factors and a previously defined set of electrical test variables. A set of linearly independent electrical test parameters are formed based on a subset of the set of electrical test variables. The set of process factors is mapped to the linearly independent electrical test parameters. A plurality of figure-of-merit (FOM) performance models are formed based on the process factors. The FOM models are combined with the mapping to enable modeling of IC performance based on the linearly independent electrical test parameters.
机译:一种用于分析具有由数字和模拟组件组成的组中的至少一个的集成电路(IC)的方法,其中将IC设计为满足多种电路性能规格,并通过测量工艺因素和测量来监视IC的制造。先前定义的一组电气测试变量。基于该组电测试变量的子集形成一组线性独立的电测试参数。过程因子集映射到线性独立的电气测试参数。基于工艺因素形成多个品质因数(FOM)性能模型。 FOM模型与映射相结合,可以基于线性独立的电气测试参数对IC性能进行建模。

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