首页> 外国专利> Method and apparatus for detecting and automatically identifying defects in technical equipment

Method and apparatus for detecting and automatically identifying defects in technical equipment

机译:检测和自动识别技术设备中的缺陷的方法和设备

摘要

A method and apparatus for detecting and automatically identifying defects in technical equipment, is disclosed. Measurement signals varying in time are downloaded as spectrograms to a computer memory. Using a predetermined criteria a set of designated peak values is created. Using another predetermined criteria the set of designated peak values is divided into two subsets. Then in one of the subsets, peak groups differing from each other by the basic frequency values are distinguished. The second subset, created from the set of designated peak values, is searched for the presence of sidebands for peaks from each specified peak group and if the sidebands are present the basic frequency of the sidebands is calculated. Then the existence of a defect in the technical equipment is detected, and identified by comparing the basic frequencies and the basic frequencies of the sidebands with the frequency values collected in the computer memory.
机译:公开了一种用于检测和自动识别技术设备中的缺陷的方法和设备。时间变化的测量信号以频谱图的形式下载到计算机内存中。使用预定标准创建一组指定的峰值。使用另一个预定标准,将一组指定的峰值分为两个子集。然后,在子集中的一个子集中,区别由基本频率值彼此不同的峰值组。从指定的峰值集合中创建的第二子集将搜索边带的存在,以查找来自每个指定峰组的峰,如果存在边带,则计算边带的基本频率。然后,通过将基本频率和边带的基本频率与计算机内存中收集的频率值进行比较,来检测并确定技术设备中是否存在缺陷。

著录项

  • 公开/公告号US7069154B2

    专利类型

  • 公开/公告日2006-06-27

    原文格式PDF

  • 申请/专利权人 MICHAL ORKISZ;

    申请/专利号US20050524449

  • 发明设计人 MICHAL ORKISZ;

    申请日2002-10-03

  • 分类号G01B5/28;G01F5/30;G06F19/00;

  • 国家 US

  • 入库时间 2022-08-21 21:42:09

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号