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High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source
High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source
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机译:使用同步加速器或基于实验室的X射线源的高分辨率直投式X射线显微断层摄影系统
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摘要
A projection-based x-ray imaging system combines projection magnification and optical magnification in order to ease constraints on source spot size, while improving imaging system footprint and efficiency. The system enables tomographic imaging of the sample especially in a proximity mode where the same is held in close proximity to the scintillator. In this case, a sample holder is provided that can rotate the sample. Further, a z-axis motion stage is also provided that is used to control distance between the sample and the scintillator.
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