High activity, spatially distributed radiation source for accurately simulating semiconductor device radiation environments

• 1. 用于监测辐射源的装置、辐射源、监测辐射源的方法、器件制造方法 [P] . 中国专利： CN107077073B . 2018.12.07
• 2. 用于监测辐射源的装置、辐射源、监测辐射源的方法、器件制造方法 [P] . 中国专利： CN107077073A . 2017-08-18
• 3. High activity, spatially distributed radiation source for accurately simulating semiconductor device radiation environments [P] . 美国专利： US6914447B2 . 2005-07-05

  机译： 高活性，空间分布的辐射源，可精确模拟半导体器件的辐射环境

• 4. High activity, spatially distributed radiation source for accurately simulating semiconductor device radiation environments [P] . 美国专利： US2005186326A1 . 2005-08-25

  机译： 高活性，空间分布的辐射源，可精确模拟半导体器件的辐射环境

• 5. High activity, spatially distributed radiation source for accurately simulating semiconductor device radiation environments [P] . 美国专利： US2005163915A1 . 2005-07-28

  机译： 高活性，空间分布的辐射源，可精确模拟半导体器件的辐射环境

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