首页>
外国专利>
Semiconductor test items optimization method and semiconductor test item optimization program recording medium for recording the
Semiconductor test items optimization method and semiconductor test item optimization program recording medium for recording the
展开▼
机译：半导体测试项目优化方法和半导体测试项目优化程序记录介质，用于记录
展开▼
页面导航
摘要
著录项
相似文献
摘要
PROBLEM TO BE SOLVED: To reduce total costs by finding only the required test item based on result information concerning plural test items. SOLUTION: A set Mi of result information corresponding to (n) pieces of respective test items and costs Ci (i=1, 2..., n) of respective test items are inputted and in a set group Mi} (i=j1, j2,..., jk) covering the set M=M1 UM2 U...UMn (M=Mj1UMj2U...UMjk), the set group Mi}, for which total sum Cj1+Cj2+...+Cjk of costs is smaller than the total sum of costs for the (n) pieces of test items, is found and the test item corresponding to this set group is outputted.
展开▼
