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CONTINUOUS APPLICATION AND DECOMPRESSION OF TEST PATTERN TO TECHNOLOGICAL FIELD OF CIRCUIT UNDER TEST
CONTINUOUS APPLICATION AND DECOMPRESSION OF TEST PATTERN TO TECHNOLOGICAL FIELD OF CIRCUIT UNDER TEST
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机译：测试图案在电路技术领域中的连续应用与解压
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摘要
PROBLEM TO BE SOLVED: To provide a bit-compressed test pattern to a scanning chain of a circuit under a test, and to handle test patterns of different scanning chain lengths when a decompressed test pattern thereof is applied to the scanning chain.;SOLUTION: A system 30 for testing a digital circuit by the scanning chain includes a tester 21, and the circuit 24 under the test as the whole or portion thereof. The tester 21 provides one set of bit-compressed test patterns 32 from a storage device via an input channel 40 to a circuit such as an IC. A decompressor 36 in the circuit 34 decompresses the compressed pattern to be applied to the scanning chain 26. In the decompressor 36, an output is provided in every of the scanning chains 26, and the scanning chains more than input channels to the decompressor 36 are provided.;COPYRIGHT: (C)2006,JPO&NCIPI
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