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EXCITATION SPECTRUM CORRECTION TECHNIQUE IN FLUORESCENCESPECTROPHOTOMETER

机译:荧光分光光度计中的激发光谱校正技术

摘要

PROBLEM TO BE SOLVED: To provide a spectrum correction technique usable to a wide range of wavelength and also applicable to a fluorescencespectrophotometer, in which the variable range of wavelength of excitation spectrometer is differ greatly to the variable range of fluorescencespectrometer.;SOLUTION: Using a spectro-monitor B composed in centering around a spectroscope 15 with the wavelength extent including the wavelength extent of excitation spectrometer 2 of the fluorescencespectrophotometer A and a known tungsten standard lamp C with known wavelength strength property, firstly the wavelength characteristic of spectro-monitor B is derived from the spectrum of tungsten standard lamp C, and next, while measuring light from the excitation spectrometer 2 with the spectro-monitor B, the both is scanned synchronously and using the acquired spectrum the wavelength characteristic is derived of excitation system. Finally, by measuring the spectrum of tungsten standard lamp C with the fluorescencespectroscope 7 the wavelength characteristic of fluorescence system is derived.;COPYRIGHT: (C)2007,JPO&INPIT
机译:要解决的问题:提供一种光谱校正技术,该技术可用于广泛的波长范围,并且还适用于荧光分光光度计,其中激发光谱仪的波长变化范围与荧光光谱仪的可变范围相差很大;解决方案:使用光谱监视器B以光谱仪15为中心,其波长范围包括荧光光谱仪A的激发光谱仪2的波长范围和具有已知波长强度特性的已知钨标准灯C,首先,光谱监视器B的波长特性为由钨标准灯C的光谱得出,然后,用分光监控器B测量来自激发光谱仪2的光,同时对两者进行扫描,并使用所获得的光谱得出激发系统的波长特性。最后,通过用荧光光谱仪7测量钨标准灯C的光谱,得出了荧光系统的波长特性。;版权:(C)2007,JPO&INPIT

著录项

  • 公开/公告号JP2006300632A

    专利类型

  • 公开/公告日2006-11-02

    原文格式PDF

  • 申请/专利权人 SHIMADZU CORP;

    申请/专利号JP20050120799

  • 发明设计人 WATANABE YASUYUKI;

    申请日2005-04-19

  • 分类号G01J3/443;G01J3/02;G01N21/64;

  • 国家 JP

  • 入库时间 2022-08-21 21:55:52

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