首页> 外国专利> Sub-aquatic base e.g. submarine base, geotechnical characterization process for ship, involves interpreting reflection signals as sum of late arrived and attenuated rays corresponding to reflection of incident wave by different base layers

Sub-aquatic base e.g. submarine base, geotechnical characterization process for ship, involves interpreting reflection signals as sum of late arrived and attenuated rays corresponding to reflection of incident wave by different base layers

机译:亚水生基地潜艇基地,船舶的岩土工程表征过程,涉及将反射信号解释为与不同基层的入射波反射相对应的迟到射线和衰减射线之和

摘要

The process involves implementing an analysis phase by deducing physical parameters of each layer of a sub-aquatic base (B) from a series of reflection signals. Each reflection signal is interpreted as a sum of late arrived and attenuated rays corresponding to reflection of an incident wave by different base layers, using angular and frequency dependency of a reflection coefficient of the incident wave on interfaces.
机译:该过程涉及通过从一系列反射信号中推论出水下水生基础(B)每一层的物理参数来实施分析阶段。使用入射波的反射系数在界面上的角度和频率依赖性,将每个反射信号解释为与不同基层对入射波的反射相对应的延迟到达光线和衰减光线的总和。

著录项

  • 公开/公告号FR2867568A1

    专利类型

  • 公开/公告日2005-09-16

    原文格式PDF

  • 申请/专利权人 DEMOULIN XAVIER;

    申请/专利号FR20040002656

  • 发明设计人 DEMOULIN XAVIER;SARZEAUD OLIVIER;

    申请日2004-03-15

  • 分类号G01V1/38;

  • 国家 FR

  • 入库时间 2022-08-21 21:58:13

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