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examination of a halbleitereinrichtung and processes for the manufacture of a halbleitereinrichtung including a review process
examination of a halbleitereinrichtung and processes for the manufacture of a halbleitereinrichtung including a review process
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机译:卤化物的检验和制造卤化物的方法,包括复查方法
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摘要
A process of converting simulation data to test data used for testing an integrated circuit includes the steps of detecting a transition of state of the simulation data, extracting an event (S11) from the simulation data in response to the transition, and creating the test data in response to the event. IMAGE
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