首页> 外国专利> Phase change memory cell programming method, involves heating memory cell to couple of temperatures, applying current to cell by current generating circuit, and causing circuit to apply reset and set pulses by controller

Phase change memory cell programming method, involves heating memory cell to couple of temperatures, applying current to cell by current generating circuit, and causing circuit to apply reset and set pulses by controller

机译:相变存储单元编程方法,包括加热存储单元至温度耦合,通过电流产生电路向单元施加电流,以及使电路通过控制器施加复位和设置脉冲

摘要

The method involves heating a memory cell to a couple of temperatures. A write drive circuit (600) comprising a controller to control an operation of voltage reduction and current stage control circuits. A current generating circuit is connected to the reduction circuit and the control circuit. The generating circuit applies current to the cell. The controller causes the generating circuit to apply reset and set pulses. An independent claim is also included for a driver for a phase change memory cell having a higher resistive state and a lower resistive state.
机译:该方法包括将存储单元加热到几个温度。写驱动电路(600)包括控制电压降低操作和电流级控制电路的控制器。电流产生电路连接到减小电路和控制电路。产生电路向电池施加电流。控制器使产生电路施加复位和设置脉冲。还包括具有较高电阻状态和较低电阻状态的相变存储单元的驱动器的独立权利要求。

著录项

  • 公开/公告号DE102004039977A1

    专利类型

  • 公开/公告日2005-03-17

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号DE20041039977

  • 发明设计人 CHO BEAK-HYUNG;YI JI-HYE;HA YONG-HO;

    申请日2004-08-12

  • 分类号G11C16/02;

  • 国家 DE

  • 入库时间 2022-08-21 22:00:44

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