首页> 外国专利> Production of semiconductor structure having recess comprises forming covering layer, and stopping the process after exposing the base region of the covering layer

Production of semiconductor structure having recess comprises forming covering layer, and stopping the process after exposing the base region of the covering layer

机译:具有凹陷的半导体结构的制造包括形成覆盖层,以及在暴露覆盖层的基极区之后停止该工艺。

摘要

Production of a semiconductor structure having a recess (2) comprises forming a covering layer (5) on a base region, on a wall region and a peripheral region of the recess in an anisotropic plasma process having an adjustable etching rate and deposition rate so that the base region is more quickly etched than the wall region and the peripheral region, and stopping the process after exposing the base region of the covering layer.
机译:具有凹部(2)的半导体结构的制造包括在各向异性的等离子体工艺中在凹部的基部区域,壁部区域和外围区域上形成覆盖层(5),该各向异性等离子体工艺具有可调节的蚀刻速率和沉积速率,使得基部区域比壁区域和周边区域更快地被蚀刻,并且在暴露覆盖层的基部区域之后停止工艺。

著录项

  • 公开/公告号DE10345402A1

    专利类型

  • 公开/公告日2005-05-04

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号DE2003145402

  • 发明设计人 KOEHLER DANIEL;

    申请日2003-09-30

  • 分类号H01L21/3065;

  • 国家 DE

  • 入库时间 2022-08-21 22:01:11

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