首页> 外国专利> Scanning microscope, especially confocal scanning microscope, has a semiconductor light source that generates an illumination beam that passes through spectral splitting and screening means associated with the detection light path

Scanning microscope, especially confocal scanning microscope, has a semiconductor light source that generates an illumination beam that passes through spectral splitting and screening means associated with the detection light path

机译:扫描显微镜,特别是共聚焦扫描显微镜,具有半导体光源,该半导体光源产生照射光束,该照射光束穿过与检测光路相关的光谱分裂和屏蔽装置

摘要

Scanning microscope has a light source which generates an illumination light beam for illumination of a sample, with means for spectrally splitting and at least partially screening the detection light emitted by the sample. The illuminating light beam travels through the spectral splitting and screening means.
机译:扫描显微镜具有产生用于照明样品的照明光束的光源,该光源具有用于光谱分裂并至少部分屏蔽由样品发射的检测光的装置。照明光束穿过光谱分离和屏蔽装置。

著录项

  • 公开/公告号DE10337296A1

    专利类型

  • 公开/公告日2005-03-03

    原文格式PDF

  • 申请/专利权人 LEICA MICROSYSTEMS HEIDELBERG GMBH;

    申请/专利号DE2003137296

  • 发明设计人 KNEBEL WERNER;MOELLMANN KYRA;

    申请日2003-08-14

  • 分类号G02B21/00;G02B21/06;

  • 国家 DE

  • 入库时间 2022-08-21 22:01:16

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