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A method for determining the surface structure of a sample of material with ultrashort laser pulses and apparatus for carrying out the method

机译:用超短激光脉冲确定材料样品表面结构的方法和实施该方法的设备

摘要

A method for determining the surface structure of a material sample, in the case of the laser pulses with a pulse duration of 1 to 100 femtoseconds are generated, and through a microscope device comprising a lens of a numerical aperture of 0,5 to 1,0 are routed, and a respective laser pulse (14) to a with respect to the position of the material sample with x, y and z - coordinates defined spatial point is focused adjustable in a targeted manner, whereby subsequently, as a function of the variation of the z - the direction of the plasma luminescence, the from the interaction of the laser pulse with the sample results, from the focal area of the laser pulse (14) with the lens (20) of the microscope device is collected.a) the intensity of the laser pulse (14) in the focus is set to a value of the above the threshold for generating a plasma during the material of the material sample (22) is,b) wherein the collected from the interaction resulting plasma radiation is detected,c) wherein the detected signal with respect to its intensity in relation to the z - the direction of the evaluated..
机译:在产生脉冲持续时间为1至100飞秒的激光脉冲的情况下,并通过包括数值孔径为0.5至1的透镜的显微镜装置,产生一种确定材料样品的表面结构的方法。传送0且相对于材料样品的位置具有x,y和z的相应激光脉冲(14)到达-坐标定义的空间点以有针对性的方式聚焦可调,从而随后根据收集z的变化-等离子体发光的方向,激光脉冲与样品相互作用的结果,激光脉冲(14)与显微镜设备的透镜(20)的聚焦区域。 )将焦点上的激光脉冲(14)的强度设置为高于在材料样品(22)的材料期间产生等离子体的阈值的值是b),其中从相互作用产生的等离子体辐射中收集c)其中检测到的信号相对于其相对于z的强度-评估的方向。

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