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Fault analysis memory for a semiconductor memory - testing apparatus, and storage method with the use of the fault analysis memory
Fault analysis memory for a semiconductor memory - testing apparatus, and storage method with the use of the fault analysis memory
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机译：用于半导体存储器的故障分析存储器-测试设备以及使用该故障分析存储器的存储方法
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摘要
Fault analysis memory for storing error data, the the result of a by means of logic comparators (15a, 15d), which is constructed as a comparison between data, which in the test of a plurality of storing (14a, 14d) are read out, and select the data device, comprisinga plurality of error data compression / bit position - adjusting means (20a, 20d), which are each provided with the fault data of any one of the logic comparator (15a, 15d) and to the compression is to be supplied to said error data one-bit errors are data and to its output to respectively different bit positions are provided, anda storage section (16c) for storing the compressed error data, which is composed of the different bit positions of the plurality of error data compression / bit position - adjusting means (20a, 20d), to corresponding bit positions of the respective words.
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