首页> 外国专利> DETERMINATION OF HORIZONTAL (PARTIAL) POTATO GENUS DURABILITY LEVEL TO POTATO BLIGHT BASED ON AGRESSIVITY LEVEL OF PHYTOPHTHORA INFESTANS (MONT) DE BARRY PATHOGENE

DETERMINATION OF HORIZONTAL (PARTIAL) POTATO GENUS DURABILITY LEVEL TO POTATO BLIGHT BASED ON AGRESSIVITY LEVEL OF PHYTOPHTHORA INFESTANS (MONT) DE BARRY PATHOGENE

机译：基于破伤风（MONT）DE BARRY病原菌的亲和力水平测定马铃薯（百日草）水平对马铃薯枯萎病的耐性水平

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FIELD: agriculture, in particular determination of horizontal (partial) potato genus durability level to potato blight.;SUBSTANCE: leaves of each genus sample are contaminated with P.infestans isolates followed by necrosis calculation and their size measurement. Spore formation productivity is measured and potato plant durability to potato blight based on alignment chart is determined.;EFFECT: method for durability estimation with simultaneous using of pathogene isolates from several regions and for sensibility determination of target potato genus to P.infestans in various geographical zones.;1 dwg, 1 tbl

机译：领域：农业，尤其是确定水平（部分）马铃薯属对马铃薯白叶枯病的持久性水平;物质：每个属样品的叶子都被致病疫霉分离株污染，然后进行坏死计算和大小测量。效果：通过比对图测量孢子形成生产力并确定马铃薯植物对马铃薯白叶枯病的耐受性;效果：同时使用多个地区的病原体分离株进行持久性估算以及在不同地理区域确定目标马铃薯属对致病疫霉的敏感性的方法1 dwg，1 tbl

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公开/公告号RU2260935C2

专利类型
公开/公告日2005-09-27

原文格式PDF
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申请/专利号RU20030116593
发明设计人 ROGOZHIN A.N.;SPIGLAZOVA S.JU.;SMETANINA T.I.;GUREVICH B.I.;KUZNETSOVA M.A.;FILIPPOV A.V.;
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申请日2003-06-05
分类号A01H1/04;A01G7/00;
国家 RU
入库时间 2022-08-21 22:01:55

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