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Spectral characteristic measuring apparatus and method for correcting wavelength shift of spectral sensitivity in the apparatus

机译:光谱特性测量装置和校正装置中光谱灵敏度的波长偏移的方法

摘要

A spectral characteristic measuring apparatus is provided with a memory and a CPU. The memory stores a spectral profile output from a sample light sensor array when light from a lamp is received, and a plurality of spectral profiles to be output from the sensor array at each displaced position in the case where a light separator is displaced relative to a grating member of the sensor array at a certain pitch stepwise in a wavelength diffusing direction. The CPU controls the lamp to emit light in a state that a white plate for calibration is disposed as a sample, compares a spectral profile output from the sensor array for correction with each spectral profile stored in the memory, and sets a displacement amount corresponding to the spectral profile that is most approximate to the corrective spectral profile as a wavelength shift correction amount.
机译:光谱特性测量装置设有存储器和CPU。当接收到来自灯的光时,该存储器存储从样本光传感器阵列输出的光谱轮廓,并且在分光器相对于光源移位的情况下,在每个位移位置从传感器阵列输出多个光谱轮廓。传感器阵列的光栅元件在波长扩散方向上以一定的间距逐步增大。 CPU在放置用于校准的白板作为样品的状态下控制灯发光,将用于校正的传感器阵列输出的光谱图与存储在存储器中的每个光谱图进行比较,并设置与最接近于校正光谱轮廓的光谱轮廓作为波长偏移校正量。

著录项

  • 公开/公告号US6876448B2

    专利类型

  • 公开/公告日2005-04-05

    原文格式PDF

  • 申请/专利权人 KENJI IMURA;SUSUMU ICHIKAWA;

    申请/专利号US20020193291

  • 发明设计人 KENJI IMURA;SUSUMU ICHIKAWA;

    申请日2002-07-12

  • 分类号G01J3/28;

  • 国家 US

  • 入库时间 2022-08-21 22:19:12

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