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Atomic force microscope and method for determining properties of a sample surface using an atomic force microscope
Atomic force microscope and method for determining properties of a sample surface using an atomic force microscope
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机译:原子力显微镜和使用原子力显微镜确定样品表面特性的方法
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摘要
A method for determining properties of a sample surface using an atomic force microscope includes applying a first voltage between the sample and a probe, moving the probe towards the surface of the sample, and stopping movement of the probe towards the surface of the sample when current in the probe is initially detected. An oscillating magnetic field is applied to the probe such that the probe obtains stable contact with the surface of the sample.
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