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FAULT DETECTION METHOD OF LASER DIODE, SEMICONDUCTOR LASER EQUIPMENT AND SEMICONDUCTOR LASER EXCITATION SOLID-STATE LASER EQUIPMENT
FAULT DETECTION METHOD OF LASER DIODE, SEMICONDUCTOR LASER EQUIPMENT AND SEMICONDUCTOR LASER EXCITATION SOLID-STATE LASER EQUIPMENT
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机译：激光二极管的故障检测方法，半导体激光设备和半导体激光激发固态激光设备
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摘要
PROBLEM TO BE SOLVED: To provide the fault detection method of a laser diode, with which the laser diode that breaks down is located without stopping ejection of a laser beam when the laser diode breaks down at an open mode, and also to provide semiconductor laser equipment and semiconductor laser excitation solid-state laser equipment having the semiconductor laser equipment.;SOLUTION: Equipment is provided with the laser diodes 2, bypass diodes 3 which are connected to all the laser diodes 2 in parallel and in a forward direction and have larger voltage characteristics than the laser diodes 2, and a fault detector 5 which detects both end voltages of the laser diodes 2 in which a threshold larger than a total of the forward direction voltages of the laser diodes 2 is set and detects an open mode fault when the voltage exceeds the threshold.;COPYRIGHT: (C)2005,JPO&NCIPI
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