首页> 外国专利> OPTICAL WAVELENGTH MEASURING METHOD, OPTICAL WAVELENGTH MEASURING DEVICE, AND OPTICAL SPECTRUM ANALYSIS DEVICE

OPTICAL WAVELENGTH MEASURING METHOD, OPTICAL WAVELENGTH MEASURING DEVICE, AND OPTICAL SPECTRUM ANALYSIS DEVICE

机译:光学波长测量方法,光学波长测量装置和光学光谱分析装置

摘要

PROBLEM TO BE SOLVED: To precisely measure the wavelength of a light without using a reference light source.;SOLUTION: The light to be measured is branched to two by a branching means 21, and the intensity Ea of one light Pd is detected by a light receiver 22. The other light Pe is incident on a transmitting element 23 having the transmitting characteristic in that the transmittance to light is changed depending on the wavelength, and the intensity Eb of its outgoing light Pe' is detected by a light receiver 24. A transmittance calculation means 30 calculates the transmittance H of the light to be measured to the transmitting element 23 from the detected two intensities of the light. A wavelength detection means 33 determines the wavelength λx of the light Pc to be measured on the basis of the calculated transmittance H and the transmitting characteristic of the transmitting element 23.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:在不使用参考光源的情况下精确地测量光的波长;解决方案:待测光通过分支装置21分支为两个,并且一个光Pd的强度Ea通过光接收器22将另一光Pe入射到具有透射特性的透射元件23上,其中,光的透射率根据波长而变化,并且其出射光Pe'的强度Eb由光接收器24检测。透射率计算装置30从检测到的两个光的强度计算待测量的光到透射元件23的透射率H。波长检测装置33基于计算出的透射率H和透射元件23的透射特性来确定要测量的光Pc的波长λ; COPYRIGHT:(C)2005,JPO&NCIPI

著录项

  • 公开/公告号JP2004354209A

    专利类型

  • 公开/公告日2004-12-16

    原文格式PDF

  • 申请/专利权人 ANRITSU CORP;

    申请/专利号JP20030152467

  • 发明设计人 SAITO TAKANORI;

    申请日2003-05-29

  • 分类号G01J9/00;G01J3/02;G01J3/18;

  • 国家 JP

  • 入库时间 2022-08-21 22:31:21

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