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Apparatus for wavelength-dispersive trace analysis, e.g. of water surface contamination, has primary X-ray light at sample and X-ray mirrors to direct fluorescence to detector
Apparatus for wavelength-dispersive trace analysis, e.g. of water surface contamination, has primary X-ray light at sample and X-ray mirrors to direct fluorescence to detector
An apparatus (10), to give a wavelength-dispersive analysis of fluorescent radiation from a sample surface, has a primary X-ray light beam (12) aligned at the sample (14). Fluorescent rays (11, 112) are directed to a pair of multi-layer X-ray mirrors (17), where the emitted rays (112) are passed to a detector (19). The lateral width (18) of the mirrors, across the direction of incidence (111) of the fluorescent light, is equal to the sample width (140).
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