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Line-reflect-reflect (LRR) method for calibrating 4-measurement point vectoral network analyzers, where four calibration circuits comprising conduction elements of unknown length and unknown symmetrical obstacle networks are used
Line-reflect-reflect (LRR) method for calibrating 4-measurement point vectoral network analyzers, where four calibration circuits comprising conduction elements of unknown length and unknown symmetrical obstacle networks are used
Line-reflect-reflect (LRR) method for calibrating 4-measurement point vectoral network analyzers having four calibration circuits assembled from conduction elements (1-4) of unknown electrical length and an unknown, symmetrical, obstacle network (2). The conduction elements and obstacle networks are typically formed using strip line circuits manufactured using etching techniques. The obstacle network can be formed with weak transmission or without transmission and the unknown obstacle parameters are determined within the framework of the calibration.
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