首页> 外国专利> ZIG FOR MEASURING MAGNET GAUSS OF VCM ASSEMBLY, ESPECIALLY IMPROVING YIELD OF MANUFACTURING BY ORIGINALLY REMOVING FAILURE OF VCM ASSEMBLY

ZIG FOR MEASURING MAGNET GAUSS OF VCM ASSEMBLY, ESPECIALLY IMPROVING YIELD OF MANUFACTURING BY ORIGINALLY REMOVING FAILURE OF VCM ASSEMBLY

机译:用于测量VCM组件的磁高的ZIG,特别是通过原始消除VCM组件的故障来提高制造良率

摘要

PURPOSE: A zig for measuring the magnet gauss of VCM assembly is provided to improve the yield of the manufacturing by originally removing the failure of the VCM assembly. CONSTITUTION: A zig(20) for measuring the magnet gauss of VCM assembly includes a gauss meter probe(26), a gauss meter(22) and a yoke plate(30). The gauss meter probe is connected to the moving block to detect the degree of magnet gauss at the current position in response to the rotation. The gauss meter displays the value of the magnet gauss detected by the gauss meter probe to outside. And, the yoke plate is prepared on the top surface of the zig to measure the gauss of the magnet mounted on the yoke of the VCM assembly.
机译:目的:提供了一种用于测量VCM组件的磁体高斯的夹具,以通过最初消除VCM组件的故障来提高制造良率。组成:用于测量VCM组件的磁体高斯的Zig(20)包括一个高斯计探头(26),一个高斯计(22)和一个轭板(30)。高斯计探头连接到移动块,以响应于旋转来检测当前位置的磁体高斯度。高斯计将由高斯计探头检测到的磁铁高斯的值显示在外部。并且,在锯齿的顶面上准备轭板,以测量安装在VCM组件的轭上的磁体的高斯。

著录项

  • 公开/公告号KR100444382B1

    专利类型

  • 公开/公告日2004-08-04

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR19970017025

  • 发明设计人 JUNG JONG HUN;

    申请日1997-05-02

  • 分类号G01R33/12;

  • 国家 KR

  • 入库时间 2022-08-21 22:46:43

相似文献

  • 专利
  • 外文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号