首页> 外国专利> METHOD FOR FABRICATING GALLIUM NITRIDE WAFER TO EASILY SEPARATE SAPPHIRE SUBSTRATE AND AVOID DETERIORATION CAUSED BY ZnO BUFFER LAYER

METHOD FOR FABRICATING GALLIUM NITRIDE WAFER TO EASILY SEPARATE SAPPHIRE SUBSTRATE AND AVOID DETERIORATION CAUSED BY ZnO BUFFER LAYER

机译:制备氮化镓晶片以轻松分离蓝宝石基质并避免ZnO缓冲层引起的劣化的方法

摘要

PURPOSE: A method for fabricating a gallium nitride wafer is provided to easily separate a sapphire substrate and avoid deterioration caused by a ZnO buffer layer between substrate and a gallium nitride thick layer by preventing zinc from being excessively volatilized from the ZnO buffer layer. CONSTITUTION: ZnO is grown on a substrate(31) to form the first buffer layer(32). A buffer material with respect to gallium nitride is grown at a temperature at which zinc is not volatilized from the first buffer layer, so as to form the second buffer layer(33). A gallium nitride thick layer(34) is grown on the second buffer layer. The substrate and the first buffer layer are eliminated.
机译:用途:提供一种制造氮化镓晶片的方法,以通过防止锌从ZnO缓冲层中过度挥发,从而容易地分离蓝宝石衬底并避免由衬底与氮化镓厚层之间的ZnO缓冲层引起的劣化。组成:ZnO生长在基板(31)上以形成第一缓冲层(32)。在不使锌从第一缓冲层挥发的温度下生长针对氮化镓的缓冲材料,从而形成第二缓冲层(33)。在第二缓冲层上生长氮化镓厚层(34)。去除基板和第一缓冲层。

著录项

  • 公开/公告号KR100438813B1

    专利类型

  • 公开/公告日2004-07-16

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRO-MECHANICS CO. LTD.;

    申请/专利号KR19970054862

  • 发明设计人 LEE SEONG GUK;

    申请日1997-10-24

  • 分类号H01L21/20;

  • 国家 KR

  • 入库时间 2022-08-21 22:46:54

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