首页> 外国专利> SOURCE REAGENT COMPOSITION FOR CVD FORMATION OF Zr/Hf DOPED GATE DIELECTRIC AND HIGH DIELECTRIC CONSTANT METAL OXIDE THIN FILMS AND METHOD OF USING SAME

SOURCE REAGENT COMPOSITION FOR CVD FORMATION OF Zr/Hf DOPED GATE DIELECTRIC AND HIGH DIELECTRIC CONSTANT METAL OXIDE THIN FILMS AND METHOD OF USING SAME

机译:Zr / Hf掺杂栅介质和高介电常数金属氧化物薄膜的CVD形成的源试剂组成及其使用方法

摘要

Chemical vapor deposition (CVD) precursor compositions for forming Zr/Hf doped gate dielectric, ferroelectric, or high dielectric constant (k) metal oxide thin films. The precursor composition in one embodiment comprises a metal precursor having a general formula M(-diketonate)2(OR)2, wherein M is Zr or Hf, and R is t-butyl. The precursor composition may also comprise a solvent medium selected from the group consisting of ethers, glymes, tetraglymes, amines, polyamines, alcohols, glycols, aliphatic hydrocarbon solvents, aromatic hydrocarbon solvents, cyclic ethers, and compatible combinations of two or more of the foregoing.
机译:用于形成Zr / Hf掺杂的栅极电介质,铁电或高介电常数(k)金属氧化物薄膜的化学气相沉积(CVD)前体组合物。在一个实施方案中,前体组合物包含具有通式M(-二酮酸酯) 2 (OR) 2 的金属前体,其中M为Zr或Hf,且R为t丁基。前体组合物还可包含选自以下的溶剂介质:醚,甘醇二甲醚,四甘醇二甲醚,胺,多胺,醇,二醇,脂族烃溶剂,芳族烃溶剂,环状醚,以及前述中的两种或更多种的相容性组合。 。

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