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Semiconductor device having temperature detecting function, testing method, and refresh control method of semiconductor storage device having temperature detecting function
Semiconductor device having temperature detecting function, testing method, and refresh control method of semiconductor storage device having temperature detecting function
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机译:具有温度检测功能的半导体装置,测试方法以及具有温度检测功能的半导体存储装置的刷新控制方法
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摘要
A semiconductor device, a testing method and a refresh control method having a temperature detecting function to detect a predetermined temperature with little dispersion and to optimize the acting state in accordance with the predetermined temperature detected. The semiconductor device includes at least a memory cell, a refresh control circuit for switching the refresh period tREF of the memory cell, and a temperature detecting unit to be biased with a bias voltage VB+ coming from a voltage bias unit including a reference unit and a regulator unit.
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