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Semiconductor device having temperature detecting function, testing method, and refresh control method of semiconductor storage device having temperature detecting function

机译:具有温度检测功能的半导体装置,测试方法以及具有温度检测功能的半导体存储装置的刷新控制方法

摘要

A semiconductor device, a testing method and a refresh control method having a temperature detecting function to detect a predetermined temperature with little dispersion and to optimize the acting state in accordance with the predetermined temperature detected. The semiconductor device includes at least a memory cell, a refresh control circuit for switching the refresh period tREF of the memory cell, and a temperature detecting unit to be biased with a bias voltage VB+ coming from a voltage bias unit including a reference unit and a regulator unit.
机译:一种具有温度检测功能的半导体器件,测试方法和刷新控制方法,该温度检测功能具有很小的分散性来检测预定温度并根据检测到的预定温度来优化作用状态。该半导体器件至少包括存储单元,用于切换存储单元的刷新周期tREF的刷新控制电路,以及将被偏置电压VB&plus偏置的温度检测单元。来自包括基准单元和调节器单元的电压偏置单元。

著录项

  • 公开/公告号US6667925B2

    专利类型

  • 公开/公告日2003-12-23

    原文格式PDF

  • 申请/专利权人 FUJITSU LIMITED;

    申请/专利号US20020081232

  • 发明设计人 YOSHIHARU KATO;ISAMU KOBAYASHI;

    申请日2002-02-25

  • 分类号G11C70/40;

  • 国家 US

  • 入库时间 2022-08-21 23:13:28

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