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Semiconductor integrated circuit device including an ESD protection circuit with an improved ESD protection capability for input or output circuit protection
Semiconductor integrated circuit device including an ESD protection circuit with an improved ESD protection capability for input or output circuit protection
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机译：半导体集成电路器件，包括具有用于输入或输出电路保护的改进的ESD保护能力的ESD保护电路
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摘要
A semiconductor integrated circuit device includes an external connection pad, an electrostatic discharge protection circuit, an output circuit, an output pre-buffer circuit, an output-signal-fixing circuit and an internal circuit. The output-signal-fixing circuit includes a first capacitor and a second capacitor and fixes an output signal from a second pre-buffer circuit at an “L” level (low voltage) even when an output from the internal circuit is in a floating state. During an ESD test, since an output signal from the second pre-buffer circuit is fixed at an “L” level (low voltage) by the output-signal-fixing circuit, the NMIS transistor is in an OFF state. In this manner, a surge current is prevented from flowing locally into the NMIS transistor.
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