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Whether or not leakage ON test method and the leakage test equipment and the airtightness structure null tracer gas for the leakage test equipment which use

机译:使用的泄漏测试设备的泄漏ON测试方法和泄漏测试设备以及气密性结构零示踪气体

摘要

PROBLEM TO BE SOLVED: To perform a leakage test in a short time by exhausting air from the inside of a vacuum chamber in a short time without using a vacuum pump of large displacement even if an inspection object work is arranged in the vacuum chamber of the large volume.;SOLUTION: This leakage testing device is provided with an arranging process for arranging sealed structures 10, 20, 30, 40 and 50 by leaving a part for housing the inspection object work X in the vacuum chamber 60, a housing process for housing the inspection object work X in the vacuum chamber 60 provided with the sealed structures 10, 20, 30, 40 and 50, a pressure reducing process for reducing pressure of the inside of the vacuum chamber 60 more than the inspection object work X by the vacuum pump 70 and a communicating process for communicating tracer gas leaked out of the inspection object work X with a gas detector 65. Since a space in the vacuum chamber 60 reduces by the sealed structures 10, 20, 30, 40 and 50, the inside of the vacuum chamber can be exhausted in a short time.;COPYRIGHT: (C)2001,JPO
机译:解决的问题:即使在检查室的真空室内配置有检查对象,也可以在短时间内通过不使用大排量的真空泵而从真空室内将空气排出来进行泄漏试验。解决方案:该泄漏测试装置具有用于将密封结构10、20、30、40和50布置在真空室60中的用于放置检查对象工件X的部分的布置过程,该布置过程用于密封结构10、20、30、40和50。将检查对象工件X容纳在设置有密封结构10、20、30、40和50的真空腔室60中,通过该减压过程,真空腔室60内部的压力比检查对象工件X更多地减压。真空泵70和用于使从检查对象工件X泄漏出的示踪气体与气体检测器65连通的连通处理。由于密封结构10、20、30、40和50减小了真空室60中的空间,真空室的内部可以在短时间内用尽。;版权所有:(C)2001,日本特许厅

著录项

  • 公开/公告号JP3570333B2

    专利类型

  • 公开/公告日2004-09-29

    原文格式PDF

  • 申请/专利权人 ヤマハ株式会社;

    申请/专利号JP20000078229

  • 发明设计人 戸田 弘光;久保田 一成;

    申请日2000-03-21

  • 分类号G01M3/32;G01M3/20;

  • 国家 JP

  • 入库时间 2022-08-21 23:26:44

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