首页> 外国专利> METHOD FOR ANALYZING MATTER ON SUBSTRATE BY MATRIX ASSISTED LASER DESORPTION/IONIZATION TIME-OF-FLIGHT MASS SPECTROMETRY

METHOD FOR ANALYZING MATTER ON SUBSTRATE BY MATRIX ASSISTED LASER DESORPTION/IONIZATION TIME-OF-FLIGHT MASS SPECTROMETRY

机译：基质辅助激光解吸/电离飞行时间质谱的基质分析方法

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摘要

PROBLEM TO BE SOLVED: To provide a method capable of measuring molecular weight to be used for specifying matter even bonded onto a substrate through the use of Matrix Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometry (MALDI-TOF MS).;SOLUTION: When the matter is bonded onto the substrate, its bonding part is provided with a partial structure to be cut by light. By predetermined light irradiation, the matter is selectively cut at the partial structure to be cut by light. By forming an unfixed state by this, it is possible to use MALDI-TOF MS analysis.;COPYRIGHT: (C)2004,JPO

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公开/公告号JP2004037128A

专利类型
公开/公告日2004-02-05

原文格式PDF
申请/专利权人 CANON INC;
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申请/专利号JP20020191535
发明设计人 OKAMOTO HISASHI;
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申请日2002-06-28
分类号G01N27/64;C12M1/00;C12M1/34;C12N15/09;C12Q1/68;G01N27/62;G01N33/483;G01N33/50;H01J49/04;H01J49/10;H01J49/40;
国家 JP
入库时间 2022-08-21 23:27:13

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