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OPTICAL SYSTEM INSPECTION APPARATUS, OPTICAL SYSTEM INSPECTION METHOD, OPTICAL SYSTEM UNIT AND OPTICAL DEVICE

机译:光学系统检查装置,光学系统检查方法,光学系统单元和光学装置

摘要

PROBLEM TO BE SOLVED: To easily detect the relative positions of optical elements and a light beam, and to adjust and inspect the whole device having an optical system without installing a light receiving means in the optical path of a light beam even when a highly directional light source is used.;SOLUTION: An optical system inspection apparatus is applied for an optical system having optical elements for focusing or guiding a light beam generated from a light source such as a laser diode on a predetermined position. The optical system inspection apparatus is provided with two-dimensional CCD cameras 8a and 8b which acquire an image of an fθ lens 3 and an image of the scattered light of the light beam which is scattered on a predetermined face of the fθ lens 3 from a predetermined direction.;COPYRIGHT: (C)2004,JPO&NCIPI
机译:解决的问题:即使在高度定向的情况下,也无需在光束的光路上安装光接收装置,即可轻松检测光学元件和光束的相对位置,并调整和检查具有光学系统的整个设备解决方案:光学系统检查设备用于具有光学元件的光学系统,该光学元件用于将从诸如激光二极管的光源产生的光束聚焦或引导在预定位置上。光学系统检查装置具有获取fθ的图像的二维CCD照相机8a和8b。透镜3和在fθ的预定面上散射的光束的散射光的图像。镜头3从预定方向拍摄。;版权:(C)2004,JPO&NCIPI

著录项

  • 公开/公告号JP2004240019A

    专利类型

  • 公开/公告日2004-08-26

    原文格式PDF

  • 申请/专利权人 RICOH CO LTD;

    申请/专利号JP20030026939

  • 发明设计人 KAMIJO TADAHIRO;

    申请日2003-02-04

  • 分类号G02B26/10;G01J1/02;G01M11/00;

  • 国家 JP

  • 入库时间 2022-08-21 23:33:24

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