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Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages

机译:从同时测量的表面光电压快速准确确定少数载流子扩散长度的方法

摘要

Minority carrier diffusion lengths are determined fast, accurately, and conveniently by illuminating a surface of the semiconductor with a beam composed of a plurality of light fluxes each having a different wavelength modulated at a different frequency. Surface photovoltages induced by different light fluxes are simultaneously detected by monitoring surface photovoltage signals at the different modulation frequencies. The surface photovoltage signals are frequency calibrated and then used to calculated a minority carrier diffusion length.
机译:通过用由多个光束组成的光束照射半导体表面来快速,准确和方便地确定少数载流子的扩散长度,每个光束具有以不同频率调制的不同波长。通过监视处于不同调制频率的表面光电压信号,可以同时检测到由不同光束感应的表面光电压。表面光电压信号经过频率校准,然后用于计算少数载流子扩散长度。

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