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Algorithmically programmable memory tester with history FIFO's that aid in error analysis and recovery
Algorithmically programmable memory tester with history FIFO's that aid in error analysis and recovery
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机译：具有历史记录FIFO的算法可编程存储器测试仪，可帮助进行错误分析和恢复
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摘要
The problem is to branch back to an appropriate location within a memory tester test program, and also restore its state of algorithmic control, when an error associated therewith occurs later in time at the DUT. Owing to delays in pipelines connecting the program execution environment to the DUT and back again. These delays allow the program to arbitrarily advance beyond where the stimulus was given. The arbitrary advance makes it difficult to determine the exact circumstances that were associated with the error. A branch based on the error signal can restart a section of the test program, but it is likely only a template needing further test algorithm control information that varies dynamically as the test program executes. The solution is to equip the memory tester with History FIFO's whose depths are adjusted to account for the sum of the delays of the pipelines, relative to the location of that History FIFO. When the error flag is generated the desired program location and state information is present at the bottom of an appropriate History FIFO.
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