首页> 外国专利> ANTISTATIC MEASURES BASED ON CONFORMITY BETWEEN ANTISTATIC PROPERTY OF DEVICE/SYSTEM AND MEASURES PROPERTY OF IMPLEMENT FOR ANTISTATIC MEASURES

ANTISTATIC MEASURES BASED ON CONFORMITY BETWEEN ANTISTATIC PROPERTY OF DEVICE/SYSTEM AND MEASURES PROPERTY OF IMPLEMENT FOR ANTISTATIC MEASURES

机译:基于设备/系统的防静电性能和实施防静电措施的一致性的防静电措施

摘要

PROBLEM TO BE SOLVED: To construct an antistatic system free from poor reputation of numerical dependence by matching an antistatic property of a device/system with antistatic performance of an implement for antistatic measures.;SOLUTION: A physically accurate measurement method for the antistatic property is combined with a proper evaluation method for the antistatic measure performance of the implement for antistatic measures. In this way, the calculation of a proper control voltage and selection and installation of the necessary implement for antistatic measures can be systematized.;COPYRIGHT: (C)2003,JPO
机译:要解决的问题:通过将设备/系统的抗静电性能与机具的抗静电性能相匹配的抗静电措施,构建一个不受数值依赖性影响的抗静电系统。解决方案:结合针对防静电措施的工具的防静电措施性能的正确评估方法。这样,就可以系统地计算出适当的控制电压,并选择和安装必要的防静电措施。COPYRIGHT:(C)2003,JPO

著录项

  • 公开/公告号JP2003121488A

    专利类型

  • 公开/公告日2003-04-23

    原文格式PDF

  • 申请/专利权人 MURAZAKI NORIO;

    申请/专利号JP20010353879

  • 发明设计人 MURAZAKI NORIO;

    申请日2001-10-16

  • 分类号G01R31/12;G01R31/26;

  • 国家 JP

  • 入库时间 2022-08-22 00:14:44

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