首页> 外国专利> SINGLE CRYSTAL GALLIUM NITRIDE SUBSTRATE, CRYSTAL GROWTH METHOD FOR SINGLE CRYSTAL GALLIUM NITRIDE, AND PRODUCTION METHOD FOR SINGLE CRYSTAL GALLIUM NITRIDE SUBSTRATE

SINGLE CRYSTAL GALLIUM NITRIDE SUBSTRATE, CRYSTAL GROWTH METHOD FOR SINGLE CRYSTAL GALLIUM NITRIDE, AND PRODUCTION METHOD FOR SINGLE CRYSTAL GALLIUM NITRIDE SUBSTRATE

机译:单结晶氮化镓基体,单结晶氮化镓的晶体生长方法和单结晶氮化镓基体的生产方法

摘要

PROBLEM TO BE SOLVED: To overcome such difficulties that in the facet growth method for growing gallium nitride by forming and maintaining a facet, dislocation hazily extends from pit center parts comprising facet planes, thus radially developing plane defects and that since the positions where pits appear can not be controlled, a device can not be designed on the resulting single crystal.;SOLUTION: A stripe mask pattern is formed with regularity on a base substrate. On the pattern, straight V grooves (valleys) comprising facets are formed. While maintaining the V grooves (valleys), GaN is subjected to facet growth to form defects collection regions H at the V groove (valley) bottom parts comprising facet planes. Dislocation is collected at the region H to lower the dislocation in a low-defect single crystal region Z and a C-plane growth region around the region H. Because the region H is closed, the dislocation is confined and is not released again.;COPYRIGHT: (C)2003,JPO
机译:要解决的问题:为了克服这样的困难:在通过形成和保持刻面来生长氮化镓的刻面生长方法中,位错从包括刻面的凹坑中心部分模糊地延伸,从而径向地发展了平面缺陷,并且由于出现凹坑的位置无法控制,无法在所得的单晶上设计器件。解决方案:在基础基板上规则地形成条纹掩模图案。在该图案上,形成包括刻面的直的V形凹槽(谷)。在保持V型槽(谷)的同时,使GaN进行小面生长以在包括小平面的V型槽(谷)的底部形成缺陷收集区域H。错位被收集在区域H,以降低低缺陷单晶区域Z和区域H周围的C面生长区域中的错位。由于区域H是封闭的,所以错位被限制并且不再被释放。版权:(C)2003,日本特许厅

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号