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METHOD AND APPARATUS FOR HIGHLY ACCURATE X-RAY DIFFRACTION USING LOW-PHOTON-DENSITY X-RAYS

机译：低光子密度X射线用于高精度X射线衍射的方法和装置

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摘要

PPROBLEM TO BE SOLVED: To provide a method for precisely measuring information on an atomic moving-radius distribution function, an atomic arrangement, an electronic state, a quantum structure, a crystal structure or the like around a specific metallic atom in an amorphous substance such as an amorphous metal, a liquid metal, an ionic solution, a quasicrystal or the like and in a crystalline structure by using a synchroton radiation facility, and an apparatus for this method. PSOLUTION: A method in which a relationship between an accelerating voltage and a speed of electrons is calculated precisely as a ratio to a velocity of light, a method in which a stage that X-rays are diffracted by atoms in a sample is calculated precisely and a method in which a state that X-rays are generated from a bend part in an electron storage ring is calculated precisely are invented. Therefore, an electron- cluster generator by which the information on the atomic moving-radius distribution function, the atomic arrangement, the electronic state, the quantum structure, the crystal structure or the like around the specific metallic atom in the amorphous substance and in the crystalline substance can be measured precisely, the electron storage ring in which a low-electron-density bunch can go around and the X-ray diffraction apparatus are manufactured. PCOPYRIGHT: (C)2003,JPO

机译：

要解决的问题：提供一种用于精确测量围绕原子中特定金属原子的原子移动半径分布函数，原子排列，电子态，量子结构，晶体结构等信息的方法。通过使用同步辐射装置，使无定形物质，例如非晶态金属，液态金属，离子溶液，准晶体等，并以晶体结构，以及用于该方法的设备。

解决方案：一种方法，其中将加速电压与电子速度之间的关系精确地计算为与光速的比值;该方法中，X射线被样品中的原子衍射的阶段是发明一种精确地计算出电子的方法，并且发明一种方法，其中精确地计算出从电子存储环中的弯曲部分产生X射线的状态。因此，需要一种电子簇生成器，通过该簇子生成器，原子无定形物质中的特定金属原子周围的原子移动半径分布函数，原子排列，电子状态，量子结构，晶体结构等信息都可以可以精确地测量结晶物质，制造可以绕过低电子密度束的电子存储环并制造X射线衍射设备。

版权：（C）2003，日本特许厅展开▼

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公开/公告号JP2003207465A

专利类型
公开/公告日2003-07-25

原文格式PDF
申请/专利权人 KAWABATA TAKESHI;
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申请/专利号JP20020004603
发明设计人 KAWABATA TAKESHI;
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申请日2002-01-11
分类号G01N23/20;G21K1/00;G21K1/06;H05H13/04;
国家 JP
入库时间 2022-08-22 00:18:00

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